Crystallography Open Database

Information card for entry 2300766

Preview

Coordinates	2300766.cif
Original paper (by DOI)	HTML

Structure parameters

Formula	F2 Xe
Calculated formula	F2 Xe
Title of publication	A simple cryotransfer method for 3D electron diffraction measurements of highly sensitive samples
Authors of publication	Gurung, Kshitij; Uran, Erik; Motaln, Klemen; Brázda, Petr; Radan, Kristian; Lozinšek, Matic; Palatinus, Lukáš
Journal of publication	Journal of Applied Crystallography
Year of publication	2025
Journal volume	58
Journal issue	3
a	4.2249 ± 0.001 Å
b	4.2249 ± 0.001 Å
c	6.9526 ± 0.0018 Å
α	90°
β	90°
γ	90°
Cell volume	124.1 ± 0.05 Å³
Cell temperature	100 K
Ambient diffraction temperature	100 K
Number of distinct elements	2
Space group number	139
Hermann-Mauguin space group symbol	I 4/m m m
Hall space group symbol	-I 4 2
Residual factor for all reflections	0.123
Residual factor for significantly intense reflections	0.123
Weighted residual factors for significantly intense reflections	0.1585
Weighted residual factors for all reflections included in the refinement	0.1585
Goodness-of-fit parameter for significantly intense reflections	3.435
Goodness-of-fit parameter for all reflections included in the refinement	3.435
Diffraction radiation probe	electron
Diffraction radiation wavelength	0.0251 Å
Diffraction radiation type	electrons200keV
Has coordinates	Yes
Has disorder	No
Has F_obs	No

Version history

Revision	Date	Message	Files
299505 (current)	2025-05-03	cif/ Adding structures of 2300766, 2300767, 2300768 via cif-deposit CGI script.	2300766.cif