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Information card for entry 1552089
Preview
| Coordinates | 1552089.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | ZSM-5 |
|---|---|
| Chemical name | Si-MFI |
| Formula | O192 Si96 |
| Calculated formula | O192 Si96 |
| Title of publication | Automated serial rotation electron diffraction combined with cluster analysis: an efficient multi-crystal workflow for structure determination |
| Authors of publication | Wang, Bin; Zou, Xiaodong; Smeets, Stef |
| Journal of publication | IUCrJ |
| Year of publication | 2019 |
| Journal volume | 6 |
| Journal issue | 5 |
| a | 20.39 Å |
| b | 20.08 Å |
| c | 13.57 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 5555.98 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 2 |
| Space group number | 62 |
| Hermann-Mauguin space group symbol | P n m a |
| Hall space group symbol | -P 2ac 2n |
| Residual factor for all reflections | 0.2273 |
| Residual factor for significantly intense reflections | 0.196 |
| Weighted residual factors for significantly intense reflections | 0.446 |
| Weighted residual factors for all reflections included in the refinement | 0.4735 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.075 |
| Diffraction radiation wavelength | 0.0251 Å |
| Diffraction radiation type | electron |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
| Revision | Date | Message | Files |
|---|---|---|---|
| 216970 (current) | 2019-07-12 | cif/ Adding structures of 1552087, 1552088, 1552089, 1552090, 1552091, 1552092, 1552093 via cif-deposit CGI script. |
1552089.cif |
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Users of the data should acknowledge the original authors of the
structural data.